-
2
-
-
0025531358
-
-
13, pp. 743-750, Dec. 1990.
-
R. Chanchani and P. M. Hall"Temperature dependence of therma expansion of ceramics and metals for electronic packages," IEEE Trans Comp., Hybrids, Manufact. Technol., vol. 13, pp. 743-750, Dec. 1990.
-
"Temperature Dependence of Therma Expansion of Ceramics and Metals for Electronic Packages," IEEE Trans Comp., Hybrids, Manufact. Technol., Vol.
-
-
Chanchani, R.1
Hall, P.M.2
-
4
-
-
0003855525
-
-
8th ed. Cleveland, OH ASM, 1973, vol. 8, pp. 266-267.
-
"Low-expansion alloys Metals Handbook, 8th ed. Cleveland, OH ASM, 1973, vol. 8, pp. 266-267.
-
Metals Handbook
-
-
Alloys, L.-E.1
-
6
-
-
0001036448
-
-
25, no. 11, pp. 1797-1800, 1996.
-
S. C. WangC. M. Wang, C. Wang, H. L. Chang, S. Chi, Y. K. Tu, C J. Hwang, W. H. Wang, and W. H. Cheng, "Effect of thin film coatin of Au on joint strength in Invar-Invar packages," J. Electron. Mater. vol. 25, no. 11, pp. 1797-1800, 1996.
-
C. M. Wang, C. Wang, H. L. Chang, S. Chi, Y. K. Tu, C J. Hwang, W. H. Wang, and W. H. Cheng, "Effect of Thin Film Coatin of Au on Joint Strength in Invar-Invar Packages," J. Electron. Mater. Vol.
-
-
Wang, S.C.1
-
7
-
-
0031276894
-
-
20, pp. 396-402, Nov. 1997.
-
W. H. ChengY. D. Yang, S. C. Wang, S. Chi, M. T. Sheen, an J. H. Kuang, "Effect of Au thickness on laser beam penetration i semiconductor laser packages," IEEE Trans. Comp., Hybrids, Manufact Technol. B, vol. 20, pp. 396-402, Nov. 1997.
-
Y. D. Yang, S. C. Wang, S. Chi, M. T. Sheen, An J. H. Kuang, "Effect of Au Thickness on Laser Beam Penetration i Semiconductor Laser Packages," IEEE Trans. Comp., Hybrids, Manufact Technol. B, Vol.
-
-
Cheng, W.H.1
-
8
-
-
33747950709
-
-
2nd Conf. Trends Welding Res., 1989, pp. 661-665.
-
R. J. CoyleP. P. Solan, P. L. Sakach, and X. L. Yeh, "Intergranula embrittlement of laser welds by gold segregation," in Proc. ASM Int 2nd Conf. Trends Welding Res., 1989, pp. 661-665.
-
P. P. Solan, P. L. Sakach, and X. L. Yeh, "Intergranula Embrittlement of Laser Welds by Gold Segregation," in Proc. ASM Int
-
-
Coyle, R.J.1
-
9
-
-
0030289416
-
-
19, pp 764-769, Dec. 1996.
-
W. H. ChengW. H. Wang, and J. C. Chen, "Defect formatio mechanisms in laser welding technique for semiconductor laser packaging," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 19, pp 764-769, Dec. 1996.
-
W. H. Wang, and J. C. Chen, "Defect Formatio Mechanisms in Laser Welding Technique for Semiconductor Laser Packaging," IEEE Trans. Comp., Packag., Manufact. Technol. A, Vol.
-
-
Cheng, W.H.1
-
10
-
-
33747971881
-
-
26, no. 8, pp. L21-L23, 1997.
-
S. C. WangS. Chi, K. C. Hsieh, Y. D. Yang, and W. H. Cheng, "Direc evidence of Au segregation in laser welded Au-coated Invar material, J. Electron. Mater., vol. 26, no. 8, pp. L21-L23, 1997.
-
S. Chi, K. C. Hsieh, Y. D. Yang, and W. H. Cheng, "Direc Evidence of Au Segregation in Laser Welded Au-coated Invar Material, J. Electron. Mater., Vol.
-
-
Wang, S.C.1
-
13
-
-
0029370765
-
-
34, no. 9, pp. 2675-2682, 1995.
-
B. ValkR. Battig, and O. Anthamatren, "Laser welding for fibe pigtailing with long-term stability and submicron accuracy," Opt. Eng. vol. 34, no. 9, pp. 2675-2682, 1995.
-
R. Battig, and O. Anthamatren, "Laser Welding for Fibe Pigtailing with Long-term Stability and Submicron Accuracy," Opt. Eng. Vol.
-
-
Valk, B.1
-
14
-
-
0030287702
-
-
19, pp. 758-763, 1996.
-
M. K. SongS. G. Kang, N. H. Hwang, H. T. Lee, S. S. Park, and K. E. Pyun, "Laser weldability analysis of high-speed optical transmission device packaging," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 19, pp. 758-763, 1996.
-
S. G. Kang, N. H. Hwang, H. T. Lee, S. S. Park, and K. E. Pyun, "Laser Weldability Analysis of High-speed Optical Transmission Device Packaging," IEEE Trans. Comp., Packag., Manufact. Technol. A, Vol.
-
-
Song, M.K.1
-
15
-
-
0004093302
-
-
1997, ch. 4.
-
J. H. Lau and Y. H. PaoSolder Joint Reliability of EGA, CSP, Flip Chips, and Fine Pitxh SMT Assemblies. New York: McGraw-Hill, 1997, ch. 4.
-
Solder Joint Reliability of EGA, CSP, Flip Chips, and Fine Pitxh SMT Assemblies. New York: McGraw-Hill
-
-
Lau, J.H.1
Pao, Y.H.2
-
16
-
-
33747984328
-
-
27, pp. L47-L50, July 1998.
-
W. H. ChengS. C. Wang, Y. K. Tu, C. H. Chen, and K. C. Hsieh, "Defect in optoelectronic materials due to phosphorus-containing un-derlayer," J. Electron. Mater., vol. 27, pp. L47-L50, July 1998.
-
S. C. Wang, Y. K. Tu, C. H. Chen, and K. C. Hsieh, "Defect in Optoelectronic Materials Due to Phosphorus-containing Un-derlayer," J. Electron. Mater., Vol.
-
-
Cheng, W.H.1
|