Electrically induced thermal transient experiments for thermal diffusivity measurements on chemical vapor deposited diamond films

Review of Scientific Instruments

Volumn 69, Issue 5, 1998, Pages 2105-2109

  Worner E ^a   Wild, C ^a   Muller Sebert W ^a   Funer M ^a   Jehle, M ^a   Koidl, P ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002649181     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148905     Document Type: Article

References (13)

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