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Volumn 99, Issue 1-2, 1998, Pages 69-73

Quantitative texture analysis in pulse reverse current electroforming of nickel

Author keywords

Crystallographic texture; Electroforming of nickel; Nickel sulphamate; ODF; Pulse reverse current

Indexed keywords


EID: 0002645819     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(97)00523-9     Document Type: Article
Times cited : (26)

References (19)
  • 4
    • 0041807918 scopus 로고
    • H.E. Exner, V. Schumacher (Eds.), DGM, Oberursel, Germany
    • C. Kollia, N. Spyrellis, in: H.E. Exner, V. Schumacher (Eds.), Advanced Materials and Processes, vol. 2, DGM, Oberursel, Germany, 1990, p. 1151.
    • (1990) Advanced Materials and Processes , vol.2 , pp. 1151
    • Kollia, C.1    Spyrellis, N.2
  • 16
    • 0042308735 scopus 로고
    • Faraday Discussions no. 12
    • J. Amblard, M. Froment, Faraday Discussions no. 12, Faraday Symp. 12 (1978) 136.
    • (1978) Faraday Symp. , vol.12 , pp. 136
    • Amblard, J.1    Froment, M.2
  • 18
    • 0042809870 scopus 로고
    • Doctoral thesis, University of Paris
    • N. Spyrellis, Doctoral thesis, University of Paris, 1982.
    • (1982)
    • Spyrellis, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.