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Volumn 106, Issue 1-3, 1997, Pages 21-26

AFM study of excimer laser ablation of polythiophene films

Author keywords

Atomic force microscopy; Excimer laser ablation; Polythiophene films

Indexed keywords


EID: 0002644070     PISSN: 10106030     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1010-6030(97)00033-6     Document Type: Article
Times cited : (6)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.