Posterior simulation and Bayes factors in panel count data models

Journal of Econometrics

Volumn 86, Issue 1, 1998, Pages 33-54

  Chib, Siddhartha ^a   Greenberg, Edward ^b   Winkelmann, Rainer ^c  

^a WASHINGTON UNIVERSITY IN ST LOUIS   (United States)

^b WASHINGTON UNIVERSITY   (United States)

^c UNIVERSITY OF CANTERBURY   (New Zealand)

Author keywords

Bayes factor; Count data; Gibbs sampling; Importance sampling; Marginal likelihood; Markov chain Monte Carlo; Metropolis Hastings algorithm; Poisson regression

Indexed keywords

EID: 0002609888     PISSN: 03044076     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-4076(97)00108-5     Document Type: Article

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