Structural study of degraded ZnMgSSe blue light emitters

Journal of Electronic Materials

Volumn 25, Issue 2, 1996, Pages 213-216

  Nakano, K ^a   Tomiya, S ^a   Ukita, M ^a   Yoshida, H ^a   Itoh, S ^a   Morita, E ^a   Ikeda, M ^a   Ishibashi, A ^a  

^a SONY CORPORATION   (Japan)

Author keywords

Blue laser; Degradation; Dislocation; Stacking fault; ZnMgSSe

Indexed keywords

EID: 0002605832     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02666246     Document Type: Article

References (21)

1. M.A. Haase, J. Qiu, J.M. DePuydt and H. Cheng, Appl. Phys. Lett. 59, 1272 (1991).
2. H. Okuyama, K. Nakano, T. Miyajima and K. Akimoto, Jpn. J. Appl. Phys. 30, L1620 (1991).
3. N. Nakayama, S. Itoh, T. Ohata, K. Nakano, H. Okuyama, M. Ozawa, A. Ishibashi, M. Ikeda and Y. Mori, Electron. Lett. 29, 1488 (1993).
4. N. Nakayama, S. Itoh, H. Okuyama, M. Ozawa, T. Ohata, K. Nakano, M. Ikeda, A. Ishibashi and Y. Mori, Electron. Lett. 29, 2194 (1993).
5. A. Ishibashi and S. Itoh, IEEE Lasers and Electro-Optics Society's Annual Meeting, Boston, MA, 1994.
6. S. Guha, J.M. DePuydt, M.A. Haase, J. Qiu and H. Cheng, Appl. Phys. Lett. 63, 3107 (1993).
7. S. Guha, H. Cheng, M. A. Haase, J.M. DePuydt, J. Qiu, B.J. Wu and G.E. Höfler, Appl. Phys. Lett. 65, 801 (1994).
8. G.C. Hua, N. Otsuka, D.C. Grillo, Y. Fan, J. Han, M.D. Ringle, R.L. Gunshor, M. Hovinen and A.V. Nurmikko, Appl. Phys. Lett. 65, 1331 (1994).
9. S. Tomiya, E. Morita, M. Ukita, H. Okuyama, S. Itoh, K. Nakano and A. Ishibashi, Appl. Phys. Lett. 66, 1208 (1995).
10. M. Hovinen, J. Ding, A. Salokatve, A.V. Nurmikko, G.C. Hua, D.C. Grillo, Li He, J. Han, M. Ringle and R.L. Gunshor, J. Appl. Phys. 77, 4150 (1995).
11. G.M. Haugen, S. Guha, H. Cheng, J.M. DePuydt, M.A. Haase, G.E. Höfler, J. Qiu and B.J. Wu, Appl. Phys. Lett. 66, 358 (1995).
12. M. Hovinen, J. Ding, A.V. Nurmikko, G.C. Hua, D.C. Grillo, Li He, J. Han and R.L. Gunshor, Appl. Phys. Lett. 66, 2013 (1995).
13. J. Petruzzello, B. L. Greenberg, D.A. Cammack and R. Dalby, J. Appl. Phys. 63, 2299 (1988).
14. S. Guha, J.M. DePuydt, J. Qiu, G.E. Höfler, M.A. Haase, B.J. Wu and H. Cheng, Appl. Phys. Lett. 63, 3023 (1993).
15. L.H. Kuo, L. Salamanca-Riba, J.M. DePuydt, H. Cheng and J. Qiu, J. Electron. Mater. 23, 275 (1994).
16. P. Petroff and R. L. Hartman, Appl. Phys. Lett. 23, 469 (1973).
17. P.W. Hutchinson, P.S. Dobson, S. O'Hara and D.H. Newman, Appl. Phys. Lett. 26, 250 (1975).
18. J. Matsui, K. Ishida and Y. Nannichi, Jpn. J. Appl. Phys. 14, 1555 (1975).
19. Y. Nannichi, J. Matsui and K. Ishida, Jpn. J. Appl. Phys. 14, 1561 (1975).
20. L.H. Kuo, L. Salamanca-Riba, B.J. Wu, G.M. Haugen, J.M. DePuydt, G. Höfler, and H. Cheng, J. Vac. Sci. Technol. B 13, 1694 (1995).
21. S. Tomiya, M. Ukita, H. Okuyama, K. Nakano, S. Itoh, A. Ishibashi, E. Morita, and M. Ikeda, 18th Int. Conf. on Defects in Semiconductors, Sendai, Japan, July 1995.