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Volumn 21, Issue 1, 1988, Pages 59-66

X-ray diffraction line broadening due to dislocations in non-cubic materials. I. General considerations and the case of elastic isotropy applied to hexagonal crystals

(2)  Klimanek, P a   Kuzel R a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER ANALYSIS; X RAY DIFFRACTION;

EID: 0002593283     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889887009580     Document Type: Article
Times cited : (134)

References (0)
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