SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Applied Physics

Volumn 75, Issue 11, 1994, Pages 7292-7298

Simulation of electromigration based on resistor networks

(2) Patrinos, A J a Schwarz, J A a

a SYRACUSE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002579568 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.356664 Document Type: Article

Times cited : (4)

References (42)

1
- 84951887397
- (1989) Isr. J. Technol , vol.25 , pp. 23
- Vook, R.W.¹ Vankar, V.D.²

2
- 0028194722
- (1994) Mater. Chem. Phys , vol.36 , pp. 199
- Vook, R.W.¹

3
- 0019392064
- (1981) Phys. Status Solidi A , vol.63 , pp. 363
- Vávra, I.¹ Lobotka, P.² Zachar, F.³ Osvald, J.⁴

4
- 0000412142
- (1975) Thin Solid Films , vol.25 , pp. 181
- Benoist, P.¹ Martin, G.²

5
- 0015142191
- (1971) J. Appl. Phys , vol.42 , pp. 4343
- Attardo, J.M.¹ Rutlege, R.² Jack, R.C.³

6
- 0015639604
- (1973) J. Appl. Phys , vol.44 , pp. 2533
- Sigsbee, R.A.¹

7
- 84951886466
- (1981) IEEE/IRPS , vol.6 , pp. 175
- Nikawa, K.¹

8
- 84951903272
- June
- (1989) HP J , pp. 79
- Marcoux, P.J.¹ Merchant, P.P.² Naroditsky, V.³ Rehder, W.D.⁴

9
- 0021428233
- (1984) Acta Metall , vol.32 , pp. 783
- Anderson, M.P.¹ Srolovitz, D.J.² Grest, G.S.³ Sahni, P.S.⁴

10
- 0021424208
- (1984) Acta. Metall , vol.32 , pp. 793
- Srolovitz, D.J.¹ Anderson, M.P.² Sahni, P.S.³ Grest, G.S.⁴

11
- 0004275998
- Wiley, New York
- (1975) Solid State Diffusion
- Stark, J.P.¹

12
- 36149019736
- (1960) Phys. Rev , vol.117 , pp. 52
- Simmons, R.O.¹ Balluffi, R.W.²

13
- 0001714232
- (1973) Physics of Thin Films , vol.7 , pp. 257
- D’Heurle, F.M.¹ Rosenberg, R.²

14
- 84951882881
- (1993) Ph.D. thesis, Syracuse University
- Patrinos, A.J.¹

15
- 84951879418
- (1987) Proceedings of the 4tth IEEE VLSI Multilevel Interconnection Conference , pp. 456
- Kowk, T.¹

16
- 0026142093
- (1991) J. Mater. Res , vol.6 , pp. 731
- Arzt, E.¹ Nix, W.D.²

17
- 11644314183
- (1992) Mater. Res. Soc. Symp. Proc , vol.239 , pp. 677
- Arzt, E.¹ Kraft, O.² Sanchez, J.³ Bader, S.⁴ Nix, W.D.⁵

18
- 0006963636
- (1992) Mater. Res. Soc. Symp. Proc , vol.265 , pp. 131
- Sanchez, J.¹ Arzt, E.²

19
- 0000722238
- (1989) Appl. Phys. Lett , vol.54 , pp. 2577
- Cho, J.¹ Thompson, C.V.²

20
- 0039894758
- (1981) Appl. Phys. Lett , vol.39 , pp. 165
- Pierce, J.M.¹ Thomas, M.E.²

21
- 0018812353
- (1980) J. Appl. Phys , vol.51 , pp. 513
- Schoen, J.M.¹

22
- 84987159607
- (1981) Phys. Status Solidi A , vol.65 , pp. K107
- Vávra, I.¹ Lobotka, P.²

23
- 49149147756
- (1980) Solid-State Electron , vol.23 , pp. 481
- Staszweski, G.M.¹ Walsoe de Reca, N.E.²

24
- 0014728428
- (1970) Appl. Phys. Lett , vol.16 , pp. 80
- d’Heurle, F.M.¹ Ames, I.²

25
- 0024863690
- (1989) IEEE Proceedings of the Reliability Physics Symposium , pp. 207
- Hummel, R.E.¹

26
- 0345631058
- (1989) Appl. Phys. Lett , vol.54 , pp. 18
- Hummel, R.E.¹ Yamada, I.²

27
- 0002777393
- (1991) Appl. Phys. Lett , vol.58 , pp. 42
- Shingubara, S.¹ Nakasaki, Y.² Kaneko, H.³

28
- 84951902335
- (1989) Ph.D. thesis, Cornell University
- Plimpton, S.J.¹

29
- 84951882256
- Springfield, VA 22161 1.49
- (1993) NIH Image (National Institute of Health, National Technical Information Service, 5285 Port Royal Road
- Rasband, W.¹

30
- 84919283667
- June
- (1987) Solid State Technol , pp. 101
- Pauleau, Y.¹

31
- 0002698308
- (1967) IEEE Proceedings of the Reliability Physics Symposium , pp. 148
- Black, J.R.¹

32
- 0003354983
- (1991) J. Appl. Phys , vol.70 , pp. 172
- Kirchheim, R.¹ Kaeber, U.²

33
- 84951894173
- Schwäbisch, Gmünd, Germany Oct.
- (1992) Proceedings of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics, and Analysis
- Kirchheim, R.¹

34
- 0000697090
- (1986) J. Appl. Phys , vol.59 , pp. 3890
- Shatzkes, M.¹ Loyd, J.R.²

35
- 0024886184
- (1989) Thin Solid Films , vol.181 , pp. 57
- Chang, C.Y.¹ Vook, R.W.² Lee, Y.C.³ Hoshi, I.⁴

36
- 0015330411
- (1972) J. Appl. Phys , vol.43 , pp. 1487
- Agarwala, B.N.¹ Patnaik, B.² Schnitzel, R.³

37
- 84913065714
- Oct
- (1984) Solid State Technol , pp. 197
- Towner, J.M.¹

38
- 0000169029
- (1990) J. Electron. Mater , vol.9 , pp. 1231
- Venkataraman, R.¹ Bravman, J.C.² Nix, W.D.³ Davies, P.W.⁴ Flinn, P.A.⁵ Fraser, D.B.⁶

39
- 84896283381
- (1991) Mater. Res. Soc. Symp. Proc , vol.230 , pp. 67
- Sanchez, J.E.¹ McKnelly, L.T.² Morris, J.W.³

40
- 0025486827
- (1990) Metall. Trans. A , vol.21 , pp. 2449
- Fraser, D.R.¹ Sanchez, J.E.² Romig, A.D.³ Morris, J.W.⁴

41
- 0039706335
- (1972) Thin Solid Films , vol.10 , pp. 377
- Mader, S.¹ Herd, S.²

42
- 0003635989
- Center for Numerical Analysis at the University of Texas at Austin, Austin, TX
- (1988) NSPCG User’s Guide: A Package for Solving Large Sparse Linear Systems by Various Iterative Methods
- Oppe, T.C.¹ Joubert, W.D.² Kincaid, D.R.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.