1,3-dibenzylthiourea and 1,3-dicyclohexylthiourea

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 52, Issue 1, 1996, Pages 139-142

  Ramnathan, Akilan ^a   Sivakumar, Kandasamy ^a,c   Subramanian, Kulandaivelu ^a   Meerarani, Dravida ^b   Ramadas, Krishnamoorthy ^b   Fun, Hoong Kun ^c  

^a ANNA UNIVERSITY   (India)

^b Spic Science Foundation India   (India)

^c SCHOOL OF PHYSICS   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002565277     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270195009875     Document Type: Article

References (12)

1. Akilan, R., Sivakumar, K., Subramanian, K., Janarthanan, N., Ramadas, K. & Fun, H. K. (1995a). Acta Cryst. C51, 2446-2450.
2. Akilan, R., Sivakumar, K., Subramanian, K., Janarthanan, N., Ramadas, K. & Fun, H. K. (1995b). Acta Cryst. C51, 1627-1629.
3. Allen, F. H., Kennard, O., Watson, D. G., Brammer, L., Orpen, O. G & Taylor, R. (1987). J. Chem. Soc. Perkin Trans. 2, pp. S1-S19.
4. Gilli, G., Michelon, G. & Toniolo, C. (1968). Ric. Sci. 38, 848-849.
5. Nardelli, M. (1983). Comput. Chem. 7, 95-98.
6. Ramadas, K. & Janarthanan, N. (1995). Org. Prep. Proced. Int. Submitted.
7. Ramadas, K., Srinivasan, N. & Janarthanan, N. (1993). Tetrahedron Lett. 34, 6447-6450.
8. Sheldrick, G. M. (1990a). Acta Cryst. A46, 467-473.
9. Sheldrick, G. M. (1990b). SHELXTL/PC Users Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
10. Sheldrick, G. M. (1993). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
11. Siemens (1994). XSCAWS X-ray Single Crystal Analysis System. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
12. Toniolo, C., Valle, G., Bonora, G. M., Crisma, M., Moretto, V., Izdebski, J., Pelka, J., Pawlak, D. & Schneider, C. H. (1988). Int. J. Pept. Protein Res. 31, 77-85.