Characterization of the copper surface optimized for use as a substrate for surface-enhanced Raman scattering

Vibrational Spectroscopy

Volumn 16, Issue 1, 1998, Pages 21-29

  Kudelski, A ^a   Bukowska, J ^a   Janik Czachor, M ^b   Grochala, W ^a   Szummer, A ^c   Dolata, M ^b  

^a UNIVERSITY OF WARSAW   (Poland)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^c WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Copper electrodes; Raman spectrometry; Roughening; Surface enhanced Raman scattering

Indexed keywords

EID: 0002564905     PISSN: 09242031     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-2031(97)00049-0     Document Type: Article

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