Electrostatic interaction in scanning probe microscopy when imaging in electrolyte solutions

Nanotechnology

Volumn 3, Issue 2, 1992, Pages 60-68

  Butt, H J ^a  

^a MAX PLANCK INSTITUTE OF BIOPHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002549590     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/3/2/003     Document Type: Article

References (79)

1. Surface Studies by Scanning Tunneling Microscopy
2. Scanned-Probe Microscopes
3. van der Waals force between a spherical tip and a solid surface
4. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope
5. A simple algorithm for the calculation of the electrostatic repulsion between identical charged surfaces in electrolyte
6. The general theory of van der Waals forces
7. Electrical double layer forces. A Monte Carlo study