Study of a measurement algorithm and the measurement loss in machine vision metrology

Journal of Manufacturing Systems

Volumn 18, Issue 1, 1999, Pages 22-34

  Shiau, Yau Ren ^a   Jiang, Bernard C ^b  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Acceptance error; Line segment measurement; Measurement algorithm; Measurement loss; Rejection error

Indexed keywords

EID: 0002500484     PISSN: 02786125     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0278-6125(99)80010-7     Document Type: Article

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