A secondary ion time-of-flight mass spectrometer with an ion mirror

International Journal of Mass Spectrometry and Ion Processes

Volumn 85, Issue 1, 1988, Pages 43-67

  Tang, X ^a   Beavis, R ^a   Ens, W ^a   Lafortune, F ^a   Schueler, B ^a   Standing, K G ^a  

^a UNIVERSITY OF MANITOBA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002485640     PISSN: 01681176     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-1176(88)83004-0     Document Type: Article

References (71)

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