Comments on “A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a Two-Port Network Analyzer”

IEEE Transactions on Microwave Theory and Techniques

Volumn 31, Issue 1, 1983, Pages 79-81

  Dropkin, H ^a  

^a U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002395748     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/TMTT.1983.1131435     Document Type: Note

References (6)

1. R. A. Speciale and J. C. Tippet, “A rigorous technique for measuring the scattering matrix of a multi-port device with a two-port network analyzer,” IEEE Trans. Microwave Theory Tech., vol MTT-30, pp 661-666, May 1982
2. R. A. Speciale, “Derivation of the generalized scattering parameter renormalization transformation,” in Proc. 1980 IEEE CAS Int. Symp Circuits Syst. (Houston, TX), Apr. 28-30, 1980, pp 166-169.
3. R. A. Speciale, “A generalization of the TSD network analyzer calibration procedure, covering n-port measurements, affected by leakage errors,” IEEE Trans. Microwave Theory Tech vol. MTT-25, pp. 1100-1115, Dec. 1977.
4. R. A. Speciale, “Projective matrix transformations in microwave network theory,” in 1981 IEEE MTT-S Int. Microwave Symp. Dig. Tech Papers, (Los Angeles, CA), June 15-19, 1981, pp 510-512.
5. R. A. Speciale, “Derivation of the generalized scattering parameter renormalization transformation,” presented at Fall 1979 14th Workshop Meet. Automated Radio Frequency Tech. Group IEEE-MTT (ARFTG), (Los Angeles, CA), Nov. 11-12, 1979
6. D. Woods, “Multiport-network analysis by matrix renormalization employing voltage-wave S-parameters with complex normalization,” Proc. Inst. Elec. Eng, vol. 124, pp. 198-204, Mar. 1977.