Structural properties of granular Bi-Siox films prepared by low-energy cluster beam deposition

Materials Science and Engineering B

Volumn 49, Issue 2, 1997, Pages 110-116

  Roux, J F ^a   Bardotti, L ^a   Cabaud, B ^a   Treilleux, M ^a   Jensen, P ^a   Hoareau, A ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

Bi Sox films; Low energy cluster beam deposition; Transmission electron microscopy

Indexed keywords

BISMUTH; CERMETS; GRAIN SIZE AND SHAPE; GRANULAR MATERIALS; SILICON COMPOUNDS; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY;

CLUSTERS; LOW-ENERGY CLUSTER BEAM DEPOSITION; NANOPARTICLES;

NANOSTRUCTURED MATERIALS;

EID: 0002383592     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(97)00103-7     Document Type: Article

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