Study of misfit-dislocation formation in strained-layer heteroepitaxy using ultrahigh vacuum scanning tunneling microscopy

Materials Science and Engineering B

Volumn 37, Issue 1-3, 1996, Pages 96-100

  Springholz, G ^a   Bauer, G ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Defect formation; Heteroepitaxy; Molecular beam epitaxy; Surface morphology; Surface roughness

Indexed keywords

EID: 0002358187     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-5107(95)01463-2     Document Type: Article

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