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Volumn 58, Issue 5, 2000, Pages 661-666

Improvement of the Dipole Model of a Surface Crack

Author keywords

Dipole model; Hall element; Hall voltage; Magnetic dipole; Magnetic material; Regression; RMS error; Surface crack

Indexed keywords

ANGULAR DISTRIBUTION; CRACK TIPS; MAGNETIC FIELDS; MAGNETIC LEAKAGE; MAGNETIC MATERIALS; SURFACE DEFECTS;

EID: 0002356972     PISSN: 00255327     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (8)

References (8)
  • 2
    • 0022662530 scopus 로고
    • New Findings in the Field of Non-Destructive Magnetic Leakage Field Inspection
    • Forster, F., "New Findings in the Field of Non-Destructive Magnetic Leakage Field Inspection," NDT International, Vol. 19, No. 1, 1986, pp. 3-14.
    • (1986) NDT International , vol.19 , Issue.1 , pp. 3-14
    • Forster, F.1
  • 5
    • 0002071241 scopus 로고
    • Investigation on Quantitization of Defect and Effect of Factors Affecting Leakage Flux Density in Magnetic Leakage Flux Testing Method
    • Mukae, S., M. Katoh, and K. Nishio, "Investigation on Quantitization of Defect and Effect of Factors Affecting Leakage Flux Density in Magnetic Leakage Flux Testing Method", Nondestructive Inspection, Vol. 37, No. 11, 1988, pp. 885-894.
    • (1988) Nondestructive Inspection , vol.37 , Issue.11 , pp. 885-894
    • Mukae, S.1    Katoh, M.2    Nishio, K.3
  • 7
    • 0009284595 scopus 로고
    • Lift-Off Effect on Magnetic Leakage Flux Method and Its Application to Defect Size Estimation
    • Uetake, I., and H. Ito, "Lift-Off Effect on Magnetic Leakage Flux Method and Its Application to Defect Size Estimation," Nondestructive Inspection, Vol. 33, No. 10, 1984, pp. 788-797.
    • (1984) Nondestructive Inspection , vol.33 , Issue.10 , pp. 788-797
    • Uetake, I.1    Ito, H.2
  • 8
    • 0012301427 scopus 로고
    • Calculation of the Magnetostatic Field of Surface Defects
    • Zatsepin, N.N. and VE. Scherbinin, "Calculation of the Magnetostatic Field of Surface Defects," Defektoskopiya, Vol. 2, 1966, pp. 385-399.
    • (1966) Defektoskopiya , vol.2 , pp. 385-399
    • Zatsepin, N.N.1    Scherbinin, V.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.