The design and analysis of 2k-p × 2q-r split plot experiments

Journal of Quality Technology

Volumn 32, Issue 1, 2000, Pages 39-56

  Bisgaard, Søren ^a,b,c  

^a UNIVERSITY OF ST GALLEN   (Switzerland)

^b Institute of Technology Management   (Switzerland)

^c ASQ   (Switzerland)

Author keywords

Confounding; Cost of experimentation; Inner and outer arrays; Robust design; Split plot confounding

Indexed keywords

EID: 0002266247     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2000.11979970     Document Type: Article

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