-
2
-
-
0000527707
-
-
[2a] A. Moezzi, R. A. Bartlett, P. P. Power, Angew. Chem. 1992, 104, 1075-1076; Angew. Chem. Int. Ed. Engl. 1992, 31, 1082.
-
(1992)
Angew. Chem.
, vol.104
, pp. 1075-1076
-
-
Moezzi, A.1
Bartlett, R.A.2
Power, P.P.3
-
3
-
-
33749086075
-
-
[2a] A. Moezzi, R. A. Bartlett, P. P. Power, Angew. Chem. 1992, 104, 1075-1076; Angew. Chem. Int. Ed. Engl. 1992, 31, 1082.
-
(1992)
Angew. Chem. Int. Ed. Engl.
, vol.31
, pp. 1082
-
-
-
4
-
-
84957427093
-
-
[2b] A. Moezzi, M. M. Olmstead, P. P. Power, J Am Chem. Soc. 1992, 144, 2715-2717.
-
(1992)
J Am Chem. Soc.
, vol.144
, pp. 2715-2717
-
-
Moezzi, A.1
Olmstead, M.M.2
Power, P.P.3
-
5
-
-
84985638985
-
-
R. Littger, N. Metzler, H. Nöth, M. Wagner, M. Thomann, Chem. Ber. 1994, 127, 1901-1908.
-
(1994)
Chem. Ber.
, vol.127
, pp. 1901-1908
-
-
Littger, R.1
Metzler, N.2
Nöth, H.3
Wagner, M.4
Thomann, M.5
-
7
-
-
85163237026
-
-
Dissertation, University of Munich
-
R. Littger, Dissertation, University of Munich, 1995.
-
(1995)
-
-
Littger, R.1
-
8
-
-
33751126608
-
-
R. Littger, H. Nöth, M. Wagner, Angew. Chem. 1993, 32, 295-297; Angew. Chem. Int. Ed. Engl. 1993, 32, 295-297.
-
(1993)
Angew. Chem.
, vol.32
, pp. 295-297
-
-
Littger, R.1
Nöth, H.2
Wagner, M.3
-
9
-
-
33751126608
-
-
R. Littger, H. Nöth, M. Wagner, Angew. Chem. 1993, 32, 295-297; Angew. Chem. Int. Ed. Engl. 1993, 32, 295-297.
-
(1993)
Angew. Chem. Int. Ed. Engl.
, vol.32
, pp. 295-297
-
-
-
10
-
-
85163240817
-
-
Part of the diploma thesis of W. Ponikwar, University of Munich, 1997
-
Part of the diploma thesis of W. Ponikwar, University of Munich, 1997.
-
-
-
-
11
-
-
0004152853
-
-
(Eds.: R. Diehl, E. Fluck, R. Kosfeld), Springer Publishers. Heidelberg, New York
-
H. Nöth, B. Wrackmeyer, NMR Spectroscopy of Boron Compounds, NMR-Principles and Progress, vol. 14 (Eds.: R. Diehl, E. Fluck, R. Kosfeld), Springer Publishers. Heidelberg, New York, 1973.
-
(1973)
NMR Spectroscopy of Boron Compounds, NMR-Principles and Progress
, vol.14
-
-
Nöth, H.1
Wrackmeyer, B.2
-
12
-
-
0011002061
-
-
L. W. Hall, J. D. Odom, P. D. Ellis, J. Am. Chem. Soc. 1975, 97, 4527; B. Wrackmeyer, H. Nöth, Chem. Ber. 1976, 109, 1075-1088.
-
(1975)
J. Am. Chem. Soc.
, vol.97
, pp. 4527
-
-
Hall, L.W.1
Odom, J.D.2
Ellis, P.D.3
-
13
-
-
84982067755
-
-
L. W. Hall, J. D. Odom, P. D. Ellis, J. Am. Chem. Soc. 1975, 97, 4527; B. Wrackmeyer, H. Nöth, Chem. Ber. 1976, 109, 1075-1088.
-
(1976)
Chem. Ber.
, vol.109
, pp. 1075-1088
-
-
Wrackmeyer, B.1
Nöth, H.2
-
14
-
-
0009954905
-
-
H. Nöth, M. Wagner, Chem. Ber. 1991, 124, 1963-1972; H. Fußstetter, Dissertation, University of Munich, 1997.
-
(1991)
Chem. Ber.
, vol.124
, pp. 1963-1972
-
-
Nöth, H.1
Wagner, M.2
-
15
-
-
85163239102
-
-
Dissertation, University of Munich
-
H. Nöth, M. Wagner, Chem. Ber. 1991, 124, 1963-1972; H. Fußstetter, Dissertation, University of Munich, 1997.
-
(1997)
-
-
Fußstetter, H.1
-
16
-
-
37049082775
-
-
A. Moezzi, M. M. Olmstead, P. P. Power, J. Chem. Soc., Dalton Trans. 1992, 2429-2434.
-
(1992)
J. Chem. Soc., Dalton Trans.
, pp. 2429-2434
-
-
Moezzi, A.1
Olmstead, M.M.2
Power, P.P.3
-
18
-
-
0141498311
-
-
P. Jutzi, A. Seufert, Angew. Chem. 1976, 88, 333-334; Angew. Chem. Int. Ed. Engl. 1976, 15, 295-296.
-
(1976)
Angew. Chem.
, vol.88
, pp. 333-334
-
-
Jutzi, P.1
Seufert, A.2
-
19
-
-
84982442403
-
-
P. Jutzi, A. Seufert, Angew. Chem. 1976, 88, 333-334; Angew. Chem. Int. Ed. Engl. 1976, 15, 295-296.
-
(1976)
Angew. Chem. Int. Ed. Engl.
, vol.15
, pp. 295-296
-
-
-
21
-
-
84866580842
-
-
H. Nöth, W. Meister, Z. Naturforsch., Part B 1962, 17, 714-718; R. Littger, N. Metzler, H. Nöth, M. Wagner, M. Thomann, Chem. Ber. 1994, 127, 1901-1908.
-
(1962)
Z. Naturforsch., Part B
, vol.17
, pp. 714-718
-
-
Nöth, H.1
Meister, W.2
-
22
-
-
84985638985
-
-
H. Nöth, W. Meister, Z. Naturforsch., Part B 1962, 17, 714-718; R. Littger, N. Metzler, H. Nöth, M. Wagner, M. Thomann, Chem. Ber. 1994, 127, 1901-1908.
-
(1994)
Chem. Ber.
, vol.127
, pp. 1901-1908
-
-
Littger, R.1
Metzler, N.2
Nöth, H.3
Wagner, M.4
Thomann, M.5
-
23
-
-
85163236542
-
-
Siemens X-Ray Analytical Instruments
-
SHELXTL, Vers. 5, Siemens X-Ray Analytical Instruments, 1994.
-
(1994)
SHELXTL, Vers. 5
-
-
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