Detection and correction of bad pixels in hyperspectral sensors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2821, Issue , 1996, Pages 93-108

  Kieffer, Hugh H ^a  

^a U S GEOLOGICAL SURVEY   (United States)

Author keywords

Anomaiy correction; Bad pixel processing; Data analysis; Ground data processing; Hyperspectral; Image processing; Remote sensing; Sensor calibration; Sensor characterization

Indexed keywords

DATA HANDLING; DATA REDUCTION; GEOMETRY; IMAGE PROCESSING; REMOTE SENSING; SIGNAL TO NOISE RATIO;

BAD PIXEL REPLACEMENT; BAD PIXELS; HYPERSPECTRAL; IMAGE PROCESSING TECHNIQUE; REFLECTANCE PROPERTIES; SENSOR CALIBRATION; SENSOR CHARACTERIZATIONS; TWO-DIMENSIONAL ARRAYS;

PIXELS;

EID: 0002182973     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.257162     Document Type: Conference Paper

References (4)

1. R.W. Basedow, D.C. Carmer and MJE. Anderson, "HYDICE system, implementation and performance", Proceedings of the SPIE, V. 2480, Orlando, Florida, pp. 258-267, April 17-18, 1995
2. R. Basedow, P. Silverglate, etal., "The HYDICE Instrument Design", Proceedings of the International Symposium on Spectral Sensing Research, Vol 1, p430-445, Maui, Hawaii, Nov. 1992
3. J. Simokos, Hugfres Danbury Optical Systems letter of Sept. 21, 1995, ref HYCAT Meeting of 9/11/1995 &9/12/1995-R.W. Basedow presentation
4. Shetler, Bruce and Kieffer, Hugh, "Detection and correction of periodic and stochastic anomalies in an hyperspectral imaging system", this issue