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Volumn 672, Issue 1-4, 2000, Pages 3-20
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Lifetime measurement in 124Te
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0002172620
PISSN: 03759474
EISSN: None
Source Type: Journal
DOI: 10.1016/S0375-9474(99)00848-9 Document Type: Article |
Times cited : (23)
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References (29)
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