Universal scaling law for quench development in HTSC devices

Cryogenics

Volumn 40, Issue 1, 2000, Pages 19-27

  Rakhmanov, A L ^a   Vysotsky, V S ^b,c   Ilyin, Yu A ^b,c   Kiss, T ^b   Takeo, M ^b  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^b KYUSHU UNIVERSITY   (Japan)

^c KURCHATOV INSTITUTE   (Russian Federation)

Author keywords

HTSC tapes; Magnets; Quench; Stability

Indexed keywords

EID: 0002116609     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0011-2275(99)00132-0     Document Type: Article

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