Characterization of nanocrystalline Pd by x-ray diffraction and EXAFS

Nanostructured Materials

Volumn 1, Issue 1, 1992, Pages 47-52

  Eastman, J A ^a   Fitzsimmons, M R ^b   Muller Stach M ^b   Wallner, G ^b   Elam, W T ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MUNICH   (Germany)

^c NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002100056     PISSN: 09659773     EISSN: None     Source Type: Journal    
DOI: 10.1016/0965-9773(92)90051-X     Document Type: Article

References (12)

1. An Electron Microscope Study on Fine Metal Particles Prepared by Evaporation in Argon Gas at Low Pressure
2. Hydrogen as a probe for the average thickness of a grain boundary