Using FIB-processed AFM cantilevers to determine microtribology characteristics

Tribology Letters

Volumn 9, Issue 1-2, 2000, Pages 15-23

  Ando, Y ^a   Nagashima, T ^b   Kakuta, K ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b CHUO UNIVERSITY   (Japan)

Author keywords

Atomic force microscope; Contact area; Focused ion beam; Friction force; Parallel leaf spring; Pull off force; Relative humidity; Wear

Indexed keywords

EID: 0002087120     PISSN: 10238883     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018892007915     Document Type: Article

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