Resistivity and its temperature dependence of nanostructured NiAl at temperatures from 77 to 300 K

Journal of Applied Physics

Volumn 80, Issue 8, 1996, Pages 4776-4778

  Qin, X Y ^a   Zhang, L D ^a   Wu, B M ^b   Tian, M L ^b   Du, Y L ^b   Yang, D S ^b   Cao, L Z ^b  

^a INSTITUTE OF SOLID STATE PHYSICS   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002085169     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363417     Document Type: Article

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