c-axis penetration depth in Bi2Sr2CaCu2O8+δ single crystals measured by ac-susceptibility and cavity perturbation technique 1

JETP Letters

Volumn 71, Issue 2, 2000, Pages 92-96

  Shovkun, D V ^a   Trunin, M R ^a   Zhukov, A A ^a   Nefyodov, Yu A ^a   Bontemps, N ^b   Enriquez H ^b   Buzdin, A ^c   Daumens, M ^c   Tamegai, T ^d  

^a INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

^b ECOLE NORMALE SUPÉRIEURE   (France)

^c UNIVERSITÉ DE BORDEAUX   (France)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002053053     PISSN: 00213640     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.568288     Document Type: Article

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