High-resolution measurement of fine structure in the photoabsorption cross section of 18O

Physical Review Letters

Volumn 80, Issue 1, 1998, Pages 33-36

  Harada, H ^a   Shigetome, Y ^a   Ohgaki, H ^b   Noguchi, T ^b   Yamazaki, T ^b  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002018192     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.33     Document Type: Article

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