Stability of oriented silicalite-1 films in view of zeolite membrane preparation

Zeolites

Volumn 19, Issue 1, 1997, Pages 13-20

  Den Exter, M J ^a,e   Van Bekkum, H ^a,c   Rijn, C J M ^b,d   Kapteijn, F ^a,b   Moulijn, J A ^a,e   Schellevis, H ^a,d   Beenakker, C I N ^b,e  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c Laboratory of Nano organic chemistry   (Netherlands)

^d UNIVERSITY OF TWENTE   (Netherlands)

^e UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Compressive stress; Etching; Nonsupported; Orientation; Sensors; Silicalite 1; Tensile stress; Zeolite membranes

Indexed keywords

EID: 0001972795     PISSN: 01442449     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0144-2449(97)00044-4     Document Type: Article

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