Electromechanical properties of thin ferroelectric pb(Zr053Ti047)O3-layers

Ferroelectrics

Volumn 163, Issue 1, 1995, Pages 77-88

  Sorge, G ^a   Hauke, T ^b   Klee, M ^c  

^a Martin Luther Universitdt Halle Wittenberg ^*

^b Philips GmbH Forschungslaboratorium Aachen ^*  (Belgium)

^c PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

electrostriction; Microdisplacementmeter; thin films

Indexed keywords

EID: 0001964278     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150199508208266     Document Type: Article

References (6)

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3. W. H. Shepherd, see 2.
4. D. J. Johnson, D. T. Amm, E. Griswold, K. Sreenivas, G. Yi and M. Sayer, see 2.
5. A. S. Sonin and B. A. Strukov, Einfiihrung in die Ferroelektrizitat, Akademie-Verlag Berlin (1974).
6. M. Klee, A. De Veirman, D. J. Taylor and P. K. Larsen, Integrated Ferroelectrics, Vol. 4, Nb. 3, P-197 (1994).