On Bistable Behavior And Open-Base Breakdown Of Bipolar Transistors In The Avalanche Regime—Modeling And Applications

IEEE Transactions on Electron Devices

Volumn 39, Issue 6, 1992, Pages 1398-1409

  Reisch, Michael ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001960159     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.137320     Document Type: Article

References (15)

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