Diagnosing Dynamic Faults Using Modular Neural Nets

IEEE Expert-Intelligent Systems and their Applications

Volumn 8, Issue 2, 1993, Pages 44-53

  Leonard, James A ^a   Kramer, Mark A ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001941795     PISSN: 08859000     EISSN: None     Source Type: Journal    
DOI: 10.1109/64.207428     Document Type: Article

References (13)

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