The wavelength calibration and resolution of the SWS

Astronomy and Astrophysics

Volumn 315, Issue 2, 1996, Pages

  Valentijn, E A ^a,c   Feuchtgruber, H ^b,c   Kester, D J M ^a   Roelfsema, P R ^a,c   Barr, P ^c   Bauer, O H ^b   Beintema, D A ^a,c   Boxhoorn, D R ^a,c   De Graauw, Th ^a   Haser, L N ^b   Heske, A ^c   Heras, A M ^c   Katterloher, R O ^b   Lahuis, F ^a,c   Lutz, D ^b   Leech, K J ^c   Morris, P W ^a,c   Salama, A ^c   Schaeidt, S G ^b,c   Spoon, H W W ^a,b   Vandenbussche, B ^c,d   Wieprecht, E ^b,c   Luinge, W ^a   Wildeman, K J ^a   more..

^a SRON NETHERLANDS INSTITUTE FOR SPACE RESEARCH   (Netherlands)

^b MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^c EUROPEAN SPACE AGENCY   (Spain)

^d UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Infrared spectroscopy; Spectral resolution; Wavelength calibration

Indexed keywords

EID: 0001893027     PISSN: 00046361     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)

1. Aalders, J.W.G. et al. Cryogenics (1989) 550-552
2. Beintema D. et al., 1993, SPIE Conference Orlando USA, Infrared Detectors and Instrumentation, Vol. 1946, p. 293
3. Feuchtgruber H. et al., 1996, in this issue
4. de Graauw, Th. et al., 1996 in this issue
5. Hucht van der K. A., Lutz D., 1994, ISO Short Wavelength Spectrometer Observer's Manual, issue 2.0, ESA
6. Jennings D. E., Weber D. E., Brault J. W., 1987, J. Mol. Spectr. 126, 19
7. Kelly D. M., Lacy J. H., 1995, ApJ, 454, L161-L164
8. Kessler, M.F. et al., 1996 in this issue
9. Rothman L. S. et al. 1992, The HITRAN Molecular Database, J. Quant. Spectrosc. Radiat. Transfer Vol. 48, 5/6, 469-507
10. Schaeidt, S.G. et al., 1996 in this issue
11. Schmid-Burgk, J., 1982, in: Landolt-Boernstein, Neue Serie, 2c, 115.
12. Ulivi L., De Natale P., Inguiscio P., 1991, ApJ 378,L29
13. Valentijn, E.A et al., 1993, SPIE Conference No 2019, Infrared Technology, San Diego, USA
14. Wildeman, K.J. et al., 1987, Cryogenics 27 68-72
15. Yamada C., Kanamori H., Hirota E., 1985, J. chem. Phys., 83, 552