Measurement of the band gap of GexSi1-x/Si strained-layer heterostructures

Applied Physics Letters

Volumn 47, Issue 12, 1985, Pages 1333-1335

  Lang, D V ^a   People, R ^a   Bean, J C ^a   Sergent, A M ^a  

^a LUCENT TECHNOLOGIES   (United States)

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EID: 0001888922     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.96271     Document Type: Article

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