Determination of surface profile statistics from electromagnetic scattering data

Optics Letters

Volumn 22, Issue 1, 1997, Pages 58-60

  Malyshkin, V ^a,c   Simeonov, S ^a   McGurn, A R ^a   Maradudin, A A ^b  

^a WESTERN MICHIGAN UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001887925     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.22.000058     Document Type: Article

References (13)

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