Current-phase relationship of YBa2Cu3O7-x ramp-edge Josephson junctions

Applied Physics Letters

Volumn 76, Issue 1, 2000, Pages 100-102

  Il'ichev, E ^a   Zakosarenko, V ^a   Schultze, V ^a   Hoenig, H E ^a   Meyer, H G ^a   Subke, K O ^b   Burkhardt, H ^b   Schilling, M ^b  

^a LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001882628     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125669     Document Type: Article

References (19)

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18. The resistance of the ramp-edge junctions has been measured directly for lest structures and for some interferometer junctions after cutting the interferometer loop. In all cases the obtained resistance exceeds 1 Ω.
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