Time and space resolved measurements of visible-light and soft x-ray emission from foam z-pinch plasmas and implosions

Review of Scientific Instruments

Volumn 68, Issue 1, 1997, Pages 660-663

  Lazier, S E ^a   Barber, T L ^a   Derzon, M S ^b   Kellogg, J W ^b  

^a KTECH CORPORATION   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001848177     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147593     Document Type: Article

References (13)

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3. R. B. Spielman, R. J. Dukart, D. A. Hansom, B. A. Hammel, W. W. Hsing, M. K. Matzen, and J. L. Porter, in Proceedings of the 2nd International Conference on Dense Z-Pinches, 1989, edited by N. R. Periera, J. Davis, and N. Rostoker (AIP, New York, 1989), p. 3.
4. D. Muron, M. Hurst, and M. S. Derzon, Rev. Sci. Instrum, these proceedings.
5. M. S. Derzon et al., Rev. Sci. Instrum., these proceedings.
6. M. S. Derzon et al., Proc. SPIE 2002, 31 (1993).
7. EG&G (now Bechtel) Amador Valley Operations, Pleasanton, CA 94588.
8. Princeton Instruments, Inc., Trenton, NJ 08619.
9. Apple Computer Inc., Cupertino, CA 95014.
10. Signal Analytics Corp., Vienna, VA 22180.
11. Bicron Corp., Newbury, OH 44065.
12. C. Deeney et al., Rev. Sci. Instrum., these proceedings.
13. Tom Nash and Sandia National Labs (private communication).