Automated in situ trace element analysis of silicate materials by laser ablation inductively coupled plasma mass spectrometry

Fresenius' Journal of Analytical Chemistry

Volumn 368, Issue 1, 2000, Pages 73-78

  Chen, Zhongxing ^a,c   Canil, Dante ^a   Longerich, Henry P ^b  

^a UNIVERSITY OF VICTORIA   (Canada)

^b MEMORIAL UNIVERSITY OF NEWFOUNDLAND   (Canada)

^c UNIVERSITY OF SOUTHERN MISSISSIPPI   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001845880     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160000528     Document Type: Article

References (9)

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