The many null distributions of person fit indices

Psychometrika

Volumn 55, Issue 1, 1990, Pages 75-106

  Molenaar, Ivo W ^a   Hoijtink, Herbert ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

aberrant patterns; appropriateness measurement; log likelihood fit index; person fit; Rasch model

Indexed keywords

EID: 0001820911     PISSN: 00333123     EISSN: 18600980     Source Type: Journal    
DOI: 10.1007/BF02294745     Document Type: Article

References (34)

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