High resolution transmission electron microscopy study in VC-doped WC-Co compound

Science and Technology of Advanced Materials

Volumn 1, Issue 2, 2000, Pages 97-104

  Yamamoto, T ^a   Ikuhara, Y ^a   Sakuma, T ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Boundaries; EDS; Grain growth; HRTEM; Microstructure; WC CO

Indexed keywords

EID: 0001793279     PISSN: 14686996     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1468-6996(00)00006-1     Document Type: Article

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