A josephson sampler with 2.1 ps resolution

IEEE Transactions on Magnetics

Volumn 21, Issue 2, 1985, Pages 226-229

  Wolf, P ^a   Van Zeghbroeck, B J ^a   Deutsch, U ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001766311     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/TMAG.1985.1063713     Document Type: Article

References (12)

1. S.M. Faris, “Generation and Measurement of Ultrashort short Current Pulses with Josephson Devices”, Appl. Phys. Lett., Vol. 36, pp.1005-1007, 1980.
2. D.B. Tuckerman, “A Josephson Ultrahigh-Resolution Sampling System”, Appl. Phys. Lett., Vol. 36, pp.1008-1011, 1980.
3. R.E. Harris, P. Wolf, and D.F. Moore, “Electronically Adjustable Delay for Josephson Technology”, IEEE Electron Dev. Lett., Vol. EDL-3, pp.261-263, 1982.
4. E.P. Harris, “Turn-on Delay of Josephson Interferometer Logic Devices”, IEEE Trans. Magn., Vol. MAG-15, pp.562-569, 1978.
5. S.M. Faris, “Ultra High Resolution Sampling Technique”, U.S. Patent 4, 401, 900, Filed: Dec. 20, 1979, Issued: Aug. 30, 1983.
6. H. Akoh, S. Sakai, A. Yagi, and H. Hayakawa, “A Direct Coupled Josephson Sampler”, Jpn. J. Appl. Phys., Vol. 22, pp.L435-437, 1983.
7. S. Sakai, H. Akoh, and H. Hayakawa, “Fluxon Observation Using a Josephson Sampler”, Jpn. J. Appl. Phys., Vol. 22, pp.L479-481, 1983.
8. R.F. Broom, A. Oosenbrug, and W. Walter, “Josephson Junctions of Small Area Formed on the Edges of Niobium Films”, Appl. Phys. Lett., Vol. 37, pp.237-239, 239, 1980.
9. D.F. Moore, P. Vettiger, and T. Forster, “High Current-Density Josephson Edge-Junction Capacitance”, Physica, Vol. 108 B+C, pp.983-984, 1981.
10. D.F. Moore and G. Sasso (unpublished work).
11. B.J. Van Zeghbroeck, “Model for a Josephson Sampling Gate”, submitted for publication.
12. J.A. Valdmanis, G.A. Mourou, and C.W. Gabel, “Picosecond and Subpicosecond Optoelectronics for Measurements of Future High Speed Electronic Devices”, IEDM83 Technical Digest, pp.597-600, Dec. 1983.