Linear temperature variation of the penetration depth in YBa2Cu3O7-δ thin films

Europhysics Letters

Volumn 33, Issue 2, 1996, Pages 153-158

  De Vaulchier, L A ^a   Vieren, J P ^a   Guldner, Y ^a   Bontemps, N ^a   Combescot, R ^a   Lemaitre Y ^b   Mage, J C ^b  

^a ECOLE NORMALE SUPÉRIEURE   (France)

^b THALES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001756467     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i1996-00314-9     Document Type: Article

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