A vibrational spectroscopic comparison of vinyltriethoxysilane and vinylphosphonic acid adsorbed on oxidized aluminum

Journal of Adhesion Science and Technology

Volumn 10, Issue 2, 1996, Pages 101-121

  Coast, R ^a   Pikus, M ^a   Henriksen, P N ^a   Nitowski, G A ^b  

^a UNIVERSITY OF AKRON   (United States)

^b ALCOA TECHNICAL CENTER   (United States)

Author keywords

Aluminum; IETS; MRAIRS; Vinylphosphonic acid; Vinyltriethoxysilane

Indexed keywords

BAND POSITION; IETS; INELASTIC ELECTRON TUNNELING SPECTROSCOPY; MRAIRS; OXIDE SURFACE; OXYGEN ATOM; PHOSPHORYL OXYGEN; REFLECTION ABSORPTION INFRARED SPECTROSCOPY; RELATIVE INTENSITY; RESONANCE STRUCTURE; SPECTROSCOPIC COMPARISON; VINYL GROUP; VINYLTRIETHOXYSILANE;

ADSORPTION; ALUMINUM; INFRARED SPECTROSCOPY; LEAD; LEAD COMPOUNDS; MONOLAYERS; OXYGEN; SILICON COMPOUNDS; SINGLE CRYSTALS;

CONDENSATION REACTIONS;

EID: 0001754692     PISSN: 01694243     EISSN: 15685616     Source Type: Journal    
DOI: 10.1163/156856196X00805     Document Type: Article

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