Vibrating reed apparatus with optical detection and digital signal processing: Application to measurements on thin films

Review of Scientific Instruments

Volumn 70, Issue 3, 1999, Pages 1751-1755

  Harms, U ^b   Kempen, L ^a,b   Neuhauser H ^b  

^a IBM   (Germany)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001753922     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149663     Document Type: Article

References (10)

1. A. S. Nowick and B. S. Berry, Anelastic Relaxation in Crystalline Solids (Academic, New York, 1972).
2. R. Schmidt, Ph.D. thesis, Technical University, Darmstadt, 1992: R. Schmidt and H. Wipf. Mater. Sci. Forum 119-121, 133 (1993).
3. R. Schmidt, Ph.D. thesis, Technical University, Darmstadt, 1992: R. Schmidt and H. Wipf. Mater. Sci. Forum 119-121, 133 (1993).
4. W. E. Newell, Science 161, 1320 (1968).
5. J. Baur and A. Kulik, J. Appl. Phys. 58, 1489 (1985).
6. C. A. Volkert, J. Appl. Phys. 70, 3521 (1991).
7. U. Harms, L. Kempen, and H. Neuhäuser, Thin Solid Films 323, 153 (1998).
8. R. I. Jennrich, An Introduction to Computational Statistics: Regression Analysis (Prentice-Hall, Englewood Cliffs, NJ, 1995), p. 248.
9. T. H. Ning. and C. Hilsum, Properties of Silicon, edited by EMIS Datareviews Series (INSPEC, London, 1988).
10. H. G. Bohn, M. Prieler, C. M. Su, H. Trinkhaus, and W. Schilling, J. Phys. Chem. Solids 55, 1157 (1994).