Development of thermally formed glass optics for astronomical hard X-ray telescopes

Optics Express

Volumn 7, Issue 4, 2000, Pages 178-185

  Craig, William W ^a   Hailey, Charles J ^a   Jimenez Garate, Mario ^a   Windt, David L ^a   Harrison, Fiona A ^b   Mao, Peter H ^b   Christensen, Finn E ^c   Hussain, Ahsen M ^c  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ASTRONOMY; IMAGING SYSTEMS; SIGNAL TO NOISE RATIO; TELESCOPES; X RAY ANALYSIS;

GLASS OPTICS; MICRO-SHEET OPTICS; X-RAY OPTICS; X-RAY TELESCOPES;

GLASS;

EID: 0001744750     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.7.000178     Document Type: Article

References (9)

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2. F. A. Harrison, et al., "Development of the High-Energy Focusing Telescope (HEFT balloon experiment," to be published in "X-ray Optics, Instruments and Missions," Eds. J. Trumper and B. Aschenbach, Proc SPIE 4012, (2000).
3. F. Christensen et al., "X-ray scattering measurements from thin foil X-ray mirrors" Proc. SPIE 1546, 160, (1992).
4. D. L. Windt, W. Z. Waskiewicz, "Multilayer facilities required for extreme-ultraviolet lithography," J. Vac. Sci Technol. B 12, 3826 (1994).
5. D. Windt et a.l, "Growth, structure and performance of depth-graded W/Si multilayers for hard X-ray optics," to appear in J. Appl. Physics, (2000).
6. F. Christensen, S. Abdali, A. Hornstrup, H. Schnopper, P. Slane, S. Romaine, "High-resolution x-ray scatter and reflectivity study of sputtered IR surfaces," Proc SPIE 2011, 18 (1994).
7. M. Jimenez-Garate, W. Craig, C. Hailey, "Fast optical metrology of the hard x-ray optics for the High Energy Focusing Telescope (HEFT)," Proc. SPIE 3444, 622, (1998).
8. P. Mao, F. Harrison, D. Windt, F. Christensen, "Optimization of graded multilayer designs for astronomical x-ray telescopes," Appl. Optics 38, 4766, (1999).
9. F. Christensen et al.,"Hard X-ray characterization of HEFT single-reflection prototype," to appear in Nucl. Inst. Methods, (2000).