Lattice location of erbium in high-fluence implanted silicon-germanium: Backscattering/channeling study

Applied Physics Letters

Volumn 77, Issue 14, 2000, Pages 2154-2155

  Touboltsev, V S ^a   Raisanen J ^a   Johnson, E ^b   Johansen, A ^b   Sarholt, L ^b  

^a UNIVERSITY OF JYVÄSKYLÄ   (Finland)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001744433     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1315345     Document Type: Article

References (12)

1. S. Coffa, G. Franzò, and F. Priolo, MRS Bull. 23, 25 (1998).
2. H. Ennen, J. Schneider, G. Pomrenke, and A. Axmann, Appl. Phys. Lett. 43, 943 (1983).
3. A. Taguchi, M. Taniguchi, and K. Takhei, Appl. Phys. Lett. 60, 965 (1992).
4. G. Abstreiter, H. Brugger, T. Wolf, R. Zachai, and C. Zeller, in Two-Dimensional Systems: Physics and Devices, edited by G. Bauer, F. Kucher and H. Henrich, Springer Series in Solid State Science (Springer, Berlin, 1986), Vol. 67, p. 130 and references therein.
5. M. L. Swanson, in Handbook of Modern Ion Beam Materials Analysis, edited by J. R. Tesmer and M. Nastasi (Materials Research Society, Pittsburgh, 1995), p. 231.
6. K. Morita, Radiat. Eff. 28, 65 (1976).
7. A. Kozanecki, J. Kaczanowski, R. Wilson, and B. J. Sealy, Nucl. Instrum. Methods Phys. Res. B 118, 709 (1996).
8. Y. S. Tang, Z. Jingping, K. C. Heasman, and B. J. Sealy, Solid State Commun. 72, 991 (1989).
9. U. Wahl, A. Vantomme, J. De Wachter, R. Moons, G. Langouche, and J. G. Marques, Phys. Rev. Lett. 79, 2069 (1997).
10. M. Needels, M. Schlüter, and M. Lannoo, Phys. Rev. B 47, 15533 (1993).
11. T. B. Massalski, J. L. Murray, L. H. Bennett, and H. Baker, Binary Alloy Phase Diagrams (American Society for Metals, Metals Park, OH, 1986).
12. K. K. Bourdelle, V. A. Khodyrev, A. Johansen, E. Johnson, and L. Sarholt-Kristensen, Phys. Rev. B 50, 82 (1994).