메뉴 건너뛰기




Volumn 86, Issue 1, 1999, Pages 214-216

Migration energy for the silicon self-interstitial

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001733642     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370719     Document Type: Article
Times cited : (33)

References (20)
  • 11
    • 0000542038 scopus 로고
    • Conf. Ser. No. 31. edited by N. B. Urli and J. W. Corbett The Institute of Physics, Bristol
    • L. C. Kimerling, in Radiation Defects in Semiconductors 1976, Conf. Ser. No. 31. edited by N. B. Urli and J. W. Corbett (The Institute of Physics, Bristol, 1977), p. 221.
    • (1977) Radiation Defects in Semiconductors 1976 , pp. 221
    • Kimerling, L.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.