An ultrahigh vacuum system for the fabrication and characterization of ultrathin metal-semiconductor films and sensors

Review of Scientific Instruments

Volumn 70, Issue 4, 1999, Pages 2087-2094

  Bergh, Howard S ^a   Gergen, Brian ^a   Nienhaus, Hermann ^b   Majumdar, Arun ^c   Weinberg, W Henry ^a   McFarland, Eric W ^a  

^a University of California   (United States)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001726694     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149718     Document Type: Article

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