Depth profile analysis of thin film solar cells using SNMS and SIMS

Fresenius' Journal of Analytical Chemistry

Volumn 358, Issue 1-2, 1997, Pages 207-210

  Gastel, M ^a   Breuer, U ^a   Holzbrecher, H ^a   Becker, J S ^a   Dietze, H J ^a   Wagner, H ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001718551     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050385     Document Type: Article

References (11)

1. Migeon HN, Le Pipec C, Le Goux JJ (1985) In: Benninghoven A (ed) SIMS V. Springer Berlin Heidelberg New York, pp 155-157
2. Collington JS, Kheyrandish H, Walls JM, Wolstenholme J (1991) Thin Solid Films 200: 293-300
3. Gastel M, Breuer U, Holzbrecher H, Becker JS, Dietze H-J, Kubon M, Wagner H (1995) Fresenius J Anal Chem 353: 478-482
4. Tasaki H, Kim WY, Hallerdt M, Konagai M, Takahashi K (1988) J Appl Phys 63: 550-560
5. Schade H, Smith ZE, Thomas JH, Catalano A (1984) Thin Solid Films 117: 149-155
6. Eicke A, Bilger B (1988) Surface and Interface Analysis 12: 344-350
7. Weller HC, Mauch RH, Bauer GH (1992) Solar Energy Materials and Solar Cells 27: 217-231
8. Smole F, Topic M, Furlan J (1994) Solar Energy Materials and Solar Cells 34: 385-392
9. Boehmer E, Siebke F, Wagner H (1997) Fresenius J Anal Chem 358 (this issue)
10. Ikeda T, Sato K, Hayashi Y, Wakayama Y, Adachi K, Nishimura H (1994) Solar Energy Materials and Solar Cells 34: 379-384
11. An I, Lu Y, Wronski CR, Collins RW (1994) App Phys Lett 64: 3317-3319