Second-harmonic reflection from silicon surfaces and its relation to structural symmetry

Physical Review Letters

Volumn 51, Issue 21, 1983, Pages 1983-1986

  Tom, H W K ^a,b   Heinz, T F ^a,b   Shen, Y R ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001709396     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.51.1983     Document Type: Article

References (9)

1. Optical Constants of Epitaxial Silicon in the Region 1–3.3 eV