A review on refractive index and temperature profile measurements using laser-based interferometric techniques

Optics and Lasers in Engineering

Volumn 31, Issue 6, 1999, Pages 455-491

  Shakher, Chandra ^a   Nirala, Anil Kumar ^a,b  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b Kisan College (Sohsarai) Nalanda   (India)

Author keywords

Laser speckle techniques; Moir deflectometry; Refractive index; Talbot interferometry; Temperature profile

Indexed keywords

EID: 0001705059     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(99)00037-8     Document Type: Article

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